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Volumn 71, Issue 1-3, 2000, Pages 282-287
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Polishing, chemical etching and thermal treatment effects on surface and electrical properties of Er and Nd-doped GaSb substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
CATHODOLUMINESCENCE;
COMPOSITION EFFECTS;
CRYSTAL DEFECTS;
CRYSTAL GROWTH FROM MELT;
ERBIUM;
ETCHING;
HEAT TREATMENT;
NEODYMIUM;
POLISHING;
PRECIPITATION (CHEMICAL);
SEMICONDUCTOR DOPING;
SEMICONDUCTOR GROWTH;
GALLIUM ANTIMONIDE;
VERTICAL BRIDGMAN METHOD;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0033904555
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(99)00391-8 Document Type: Article |
Times cited : (10)
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References (13)
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