Infrared spectroscopy of Er-containing amorphous silicon thin films

Applied Physics Letters

Volumn 71, Issue 25, 1997, Pages 3679-3681

  Zanatta, A R ^a   Nunes, L A O ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; ERBIUM; HEAT TREATMENT; HYDROGEN BONDS; HYDROGENATION; INFRARED SPECTROSCOPY; LIGHT EMISSION; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SPUTTER DEPOSITION; THIN FILMS;

DANGLING BOND DENSITY; RAMAN SCATTERING MEASUREMENT; STRUCTURAL RELAXATION;

AMORPHOUS SILICON;

EID: 0031352277     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120479     Document Type: Article

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