Study of the local electrical properties of metal surfaces using an A.F.M. with a conducting probe

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 1996, Pages 205-211

  Schneegans, O ^a   Houze, F ^a   Meyer, R ^a   Boyer, L ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; COATINGS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; METALS; SURFACE ROUGHNESS; SURFACES;

CONDUCTANCE; CONDUCTING PROBE; METAL SURFACES; NANOCONTACTS;

ELECTRIC CONTACTS;

EID: 0029726133     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)