ZrO2-CeO2 and CeO2-La2O3 film growth on oxide substrates and their applications in oxide heterostructures

Journal of Crystal Growth

Volumn 209, Issue 4, 2000, Pages 828-841

  Khodan, A N ^a   Contour, J P ^b   Michel, D ^c   Durand, O ^b   Lyonnet, R ^b   Mihet, M ^b  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^b THALES   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; DEPOSITION; HIGH TEMPERATURE SUPERCONDUCTORS; LANTHANUM COMPOUNDS; LATTICE CONSTANTS; OXIDE SUPERCONDUCTORS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIA;

PULSED LASER DEPOSITION (PLD);

SUPERCONDUCTING FILMS;

EID: 0033900469     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00540-0     Document Type: Article

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