Intrinsic defects at TiO2(110) surfaces studied with scanning tunneling microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 961-965

  Fischer, Stefan ^a   Munz, Andreas W ^a   Schierbaum, Klaus Dieter ^a   Göpel, Wolfgang ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000361896     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589184     Document Type: Article

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