TCAD optimization of charge collection efficiency in silicon microstrip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 439, Issue 2, 2000, Pages 270-274

  Passeri, D ^a,b   Ciampolini, P ^a,b   Bilei, G M ^b  

^a UNIVERSITY OF PERUGIA   (Italy)

^b INFN SEZIONE DI PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; HIGH ENERGY PHYSICS; MICROSTRIP DEVICES; NUMERICAL ANALYSIS; OPTIMIZATION; RADIATION HARDENING; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

MICROSTRIP DETECTORS; SEMICONDUCTOR DETECTORS;

PARTICLE DETECTORS;

EID: 0033898289     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00843-8     Document Type: Article

References (5)

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4. D. Passen et al., IEEE Trans. Nucl. Sci NS-3 (45) (1998) 602.
5. Z. Li, Nucl. Instr. and Meth. A 360 (1995) 445.