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Volumn 69, Issue , 2000, Pages 401-405

Photoluminescence from Si ion irradiated SiO2/Si/SiO2 films with elevated substrate temperature

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; DIAMAGNETISM; ION BOMBARDMENT; IONIC CONDUCTION; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICA;

EID: 0033896109     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00309-8     Document Type: Article
Times cited : (6)

References (16)
  • 2
    • 0003656195 scopus 로고
    • Ion Implantation: Basic to Device Fabrication
    • Kluwer
    • E. Rimini, Ion Implantation: Basic to Device Fabrication, Kluwer, Dordrecht, 1995, p. 19.
    • (1995) Dordrecht , pp. 19
    • Rimini, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.