Application to argon ions of a new technique to measure the two-electron contribution to the ground state energy of helium-like ions

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 33, Issue 4, 2000, Pages 727-734

  Currell, F J ^a,c   Asada, J ^b   Back, T V ^d   Dong, C Z ^e   Margolis, H S ^f   Nakamura, N ^c   Ohtani, S ^b,c   Silver, J D ^d   Watanabe, H ^c  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^c Japan Science and Technology Agency   (Japan)

^d UNIVERSITY OF OXFORD   (United Kingdom)

^e NORTHWEST NORMAL UNIVERSITY   (China)

^f NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ARGON; ELECTRON BEAMS; ELECTRON TRAPS; GROUND STATE; X RAYS;

ELECTRON BEAM ION TRAPS (EBIT);

IONS;

EID: 0033894312     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/33/4/310     Document Type: Article

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