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Volumn 66, Issue 12, 1997, Pages 3795-3800

Characteristics of the Tokyo Electron-Beam Ion Trap

Author keywords

EBIT; Highly charged ions; Ion source; Ion trap; X ray spectra

Indexed keywords


EID: 0031350682     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.66.3795     Document Type: Article
Times cited : (59)

References (23)
  • 17
    • 0642340177 scopus 로고
    • Verein Deutscher Ingenieure, Berlin
    • Lehrgranshandbuch Kryotechnik (Verein Deutscher Ingenieure, Berlin, 1977).
    • (1977) Lehrgranshandbuch Kryotechnik


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.