-
1
-
-
0000567823
-
Phase-measurement inferferoinetry techniques
-
Wolf E (Ed.): North-Holland, Amsterdam
-
Creath K: Phase-measurement inferferoinetry techniques. In Wolf E (Ed.): Progress in Optics, pp. 350-393. North-Holland, Amsterdam 1988
-
(1988)
Progress in Optics
, pp. 350-393
-
-
Creath, K.1
-
2
-
-
0028476358
-
Phase-measuring interferometry: New methods and error analysis
-
Joenathan C: Phase-measuring interferometry: new methods and error analysis. Appl. Opt. 33 (1994) 4147-4155
-
(1994)
Appl. Opt.
, vol.33
, pp. 4147-4155
-
-
Joenathan, C.1
-
3
-
-
0027687286
-
Algorithm for phase-difference measurement in phase-shifting interferometry
-
Vikram CS, Witherow WK, Trolinger JD: Algorithm for phase-difference measurement in phase-shifting interferometry. Appl. Opt. 32 (1993) 6250-6252
-
(1993)
Appl. Opt.
, vol.32
, pp. 6250-6252
-
-
Vikram, C.S.1
Witherow, W.K.2
Trolinger, J.D.3
-
4
-
-
0000819385
-
Two-dimensional birefringence measurement using the phase-shifting technique
-
Otani Y, Shimada T, Yoshizawa T, Umeda N: Two-dimensional birefringence measurement using the phase-shifting technique. Opt. Eng. 33 (1994) 1604-1609
-
(1994)
Opt. Eng.
, vol.33
, pp. 1604-1609
-
-
Otani, Y.1
Shimada, T.2
Yoshizawa, T.3
Umeda, N.4
-
5
-
-
0030211653
-
An algorithm for profilometry by white-light phase-shifting interferometry
-
Sandoz P: An algorithm for profilometry by white-light phase-shifting interferometry. J. Mod. Opt. 43 (1996) 1545-1554
-
(1996)
J. Mod. Opt.
, vol.43
, pp. 1545-1554
-
-
Sandoz, P.1
-
6
-
-
0027242745
-
Phase shifting in photoelasticity
-
Asundi A: Phase shifting in photoelasticity. Exp. Tech. 17 (1993) 19-23
-
(1993)
Exp. Tech.
, vol.17
, pp. 19-23
-
-
Asundi, A.1
-
7
-
-
0031234801
-
On image analysis for birefringence measurements in photoelasticity
-
Patterson EA, Ji W, Wang ZF: On image analysis for birefringence measurements in photoelasticity. Opt. Lasers Eng. 28 (1997) 17-36
-
(1997)
Opt. Lasers Eng.
, vol.28
, pp. 17-36
-
-
Patterson, E.A.1
Ji, W.2
Wang, Z.F.3
-
8
-
-
0011026058
-
Whole field determination of isoclinic and isochromatic parameters
-
Plouzennec N, Dupre JC, Lagarde A: Whole field determination of isoclinic and isochromatic parameters. Exp. Tech. 23 (1999) 30-33
-
(1999)
Exp. Tech.
, vol.23
, pp. 30-33
-
-
Plouzennec, N.1
Dupre, J.C.2
Lagarde, A.3
-
9
-
-
0031332926
-
Full-field automatic evaluation of an isoclinic parameter in white light
-
Petrucci G: Full-field automatic evaluation of an isoclinic parameter in white light. Exp. Mech. 37 (1997) 420-426
-
(1997)
Exp. Mech.
, vol.37
, pp. 420-426
-
-
Petrucci, G.1
-
10
-
-
0026835762
-
Computerized image processing for whole-field determination of isoclinics and isochromatics
-
Sarma AVSSSR, Pillai SA, Subramanian G, Varadan TK: Computerized image processing for whole-field determination of isoclinics and isochromatics. Exp. Mech. 32 (1992) 24-29
-
(1992)
Exp. Mech.
, vol.32
, pp. 24-29
-
-
Sarma, A.V.S.S.S.R.1
Pillai, S.A.2
Subramanian, G.3
Varadan, T.K.4
-
11
-
-
0345202316
-
On the dependence on isoclinics of the modulation of isochromatic phase maps
-
Quiroga JA, Gonzalez-Cano A: On the dependence on isoclinics of the modulation of isochromatic phase maps. Optik 110 (1999) 253-254
-
(1999)
Optik
, vol.110
, pp. 253-254
-
-
Quiroga, J.A.1
Gonzalez-Cano, A.2
-
12
-
-
0020128359
-
Adigital phase-measurement system for real-time holographic interferometry
-
Hariharan P, Oreb BF, Brown N: Adigital phase-measurement system for real-time holographic interferometry. Opt. Commun. 41 (1982) 393-396
-
(1982)
Opt. Commun.
, vol.41
, pp. 393-396
-
-
Hariharan, P.1
Oreb, B.F.2
Brown, N.3
-
13
-
-
84975624647
-
Phase-shifting speckle interferometry
-
Creath K: Phase-shifting speckle interferometry. Appl. Opt. 24 (1985) 3053-3058
-
(1985)
Appl. Opt.
, vol.24
, pp. 3053-3058
-
-
Creath, K.1
-
14
-
-
0004656001
-
Magneto-optic rotation in birefringent media-application of the Poincare sphere
-
Ramachandran GN, Ramaseshan S: Magneto-optic rotation in birefringent media-application of the Poincare sphere. J. Opt. Soc. Am. 42 (1952) 49-56
-
(1952)
J. Opt. Soc. Am.
, vol.42
, pp. 49-56
-
-
Ramachandran, G.N.1
Ramaseshan, S.2
-
15
-
-
0343243643
-
Photoelastic studies of optically active crystal
-
Narasimhamurty TS: Photoelastic studies of optically active crystal. Proc. Ind. Acad. Sci. 40A (1954) 167-175
-
(1954)
Proc. Ind. Acad. Sci.
, vol.40 A
, pp. 167-175
-
-
Narasimhamurty, T.S.1
-
16
-
-
0008845427
-
Optical phenomena in photoelastic models by the rotation of principal axes
-
Aben HK: Optical phenomena in photoelastic models by the rotation of principal axes. Exp. Mech. 6 (1966) 13-22
-
(1966)
Exp. Mech.
, vol.6
, pp. 13-22
-
-
Aben, H.K.1
-
17
-
-
0016037623
-
Determination of the optically equivalent model in three-dimensional photoelasticity
-
Srinath LS, Sarma AVSSSR: Determination of the optically equivalent model in three-dimensional photoelasticity. Exp. Mech. 14 (1974) 118-122
-
(1974)
Exp. Mech.
, vol.14
, pp. 118-122
-
-
Srinath, L.S.1
Sarma, A.V.S.S.S.R.2
-
18
-
-
0031372386
-
Photoelastic analysis of a three-dimensional specimen by optical slicing and digital image processing
-
Dupre JC, Lagarde A: Photoelastic analysis of a three-dimensional specimen by optical slicing and digital image processing. Exp. Mech. 37 (1997) 393-397
-
(1997)
Exp. Mech.
, vol.37
, pp. 393-397
-
-
Dupre, J.C.1
Lagarde, A.2
-
19
-
-
0029639170
-
On light propagation in helicoidal bianisotropic mediums
-
Lakhtakia A, Weiglhofer WS: On light propagation in helicoidal bianisotropic mediums. Proc. R. Soc. Lond. A 448 (1995) 419-437
-
(1995)
Proc. R. Soc. Lond. A
, vol.448
, pp. 419-437
-
-
Lakhtakia, A.1
Weiglhofer, W.S.2
-
21
-
-
0001163429
-
Chiral thin solid films
-
Azzam RMA: Chiral thin solid films. Appl. Phys. Lett. 61 (1992) 3118-3120
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 3118-3120
-
-
Azzam, R.M.A.1
-
22
-
-
0031999915
-
Generalized ellipsometry and complex optical systems
-
Schubert M: Generalized ellipsometry and complex optical systems. Thin Solid Films 313-314 (1998) 323-332
-
(1998)
Thin Solid Films
, vol.313-314
, pp. 323-332
-
-
Schubert, M.1
-
23
-
-
0031998448
-
Rotating-compensator multichannel transmission ellipsometry of a thin-film helicoidal bianisotropic medium
-
Rovira PI, Yarussi RA, Collins RW, Venugopal VC, Lakhtakia A, Messier R, Robbie K, Brett MJ: Rotating-compensator multichannel transmission ellipsometry of a thin-film helicoidal bianisotropic medium. Thin Solid Films 313-314 (1998) 373-378
-
(1998)
Thin Solid Films
, vol.313-314
, pp. 373-378
-
-
Rovira, P.I.1
Yarussi, R.A.2
Collins, R.W.3
Venugopal, V.C.4
Lakhtakia, A.5
Messier, R.6
Robbie, K.7
Brett, M.J.8
-
24
-
-
0000825979
-
A new optical method and apparatus 'HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction
-
Kobayashi J, Uesu Y: A new optical method and apparatus 'HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction. J. Appl. Crystallogr. 16 (1983) 204-211
-
(1983)
J. Appl. Crystallogr.
, vol.16
, pp. 204-211
-
-
Kobayashi, J.1
Uesu, Y.2
-
26
-
-
0004269369
-
-
Marcel Dekker, Inc., New York
-
Collett E: Polarized light, pp. 187-218. Marcel Dekker, Inc., New York 1993
-
(1993)
Polarized Light
, pp. 187-218
-
-
Collett, E.1
|