In situ repair of optoelectronic devices with femtosecond laser pulses

Semiconductor Science and Technology

Volumn 15, Issue 3, 2000, Pages

  Dupont, E ^a   Zhu, X ^a   Chiu, S ^b   Moisa, S ^a   Buchanan, M ^a   Gao, M ^a   Liu, H C ^a   Corkum, P B ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b DEFENCE RESEARCH AND DEVELOPMENT CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLOGRAPHY; LASER ABLATION; LASER PULSES; LIGHT EMITTING DIODES;

FEMTOSECOND LASER PULSES;

OPTOELECTRONIC DEVICES;

EID: 0033891494     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/3/102     Document Type: Article

References (7)

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4. Dupont E, Liu H C, Buchanan M, Wasilewski Z R, St-Germain S and Chevrette P 1999 Appl. Phys. Lett. 75 563
5. Dupont E, Liu H C, Buchanan M, Chiu S and Gao M 2000 Appl. Phys. Lett. submitted
6. Zhu X, Villeneuve D M, Yu A, Naumov A Yu, Nikumb S K and Corkum P B 1999 Appl. Surf. Sci. 152 138
7. Cavalleri A, Sokolowski-Tinten K, Bialkowski J and von der Linde D 1999 Appl. Phys. Lett. 72 2385