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Volumn 211, Issue 1, 2000, Pages 211-215
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X-ray photoelectron spectroscopy investigation of substrate surface pretreatments for diamond nucleation by microwave plasma chemical vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON INORGANIC COMPOUNDS;
NUCLEATION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SILICON;
SILICON CARBIDE;
SUBSTRATES;
SURFACE TREATMENT;
X RAY PHOTOELECTRON SPECTROSCOPY;
DC BIASING;
MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITION;
SCRATCHING;
SUBSTRATE SURFACE PRETREATMENT;
ULTRASONIC ABRASION;
DIAMOND FILMS;
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EID: 0033891172
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00769-1 Document Type: Article |
Times cited : (12)
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References (16)
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