Structural phase transitions of carbon observed with photoelectron spectroscopy

Thin Solid Films

Volumn 290-291, Issue , 1996, Pages 148-152

  Reinke, P ^a,b   Francz, G ^a   Oelhafen, P ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b NONE   (Switzerland)

Author keywords

Amorphous carbon; Bias enhanced nucleation; CVD diamond; Ion irradiation; Photoelectron spectroscopy

Indexed keywords

AMORPHOUS FILMS; CHEMICAL VAPOR DEPOSITION; INCLUSIONS; INTERFACES (MATERIALS); ION BOMBARDMENT; IRRADIATION; NUCLEATION; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SILICON CARBIDE; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BIAS ENHANCED NUCLEATION (BEN); ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);

DIAMOND FILMS;

EID: 0030416341     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09095-5     Document Type: Article

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