Comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 75, Issue 1, 2000, Pages 29-37

  Dharmadhikari, C V ^a   Ali, A O ^a   Suresh, N ^b   Phase, D M ^b   Chaudhari, S M ^b   Gupta, A ^b   Dasannacharya, B A ^b  

^a UNIVERSITY OF PUNE   (India)

^b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; CRYSTAL ORIENTATION; FILM GROWTH; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON WAFERS; SILVER; SURFACE ROUGHNESS; X RAY SCATTERING;

HEIGHT-HEIGHT CORRELATION;

METALLIC FILMS;

EID: 0033890608     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00385-8     Document Type: Article

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