Surface characterization of oriented silver films on Si (100) substrates using scanning tunnelling microscopy

Thin Solid Films

Volumn 323, Issue 1-2, 1998, Pages 105-109

  Ali, A O ^a   Kshirsagar, R B ^a   Dharmadhikari, C V ^a  

^a UNIVERSITY OF PUNE   (India)

Author keywords

Oriented silver films; Scanning tunnelling microscopy; Si (100) substrates

Indexed keywords

FILM GROWTH; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SILVER; SUBSTRATES;

ORIENTED SILVER FILMS;

METALLIC FILMS;

EID: 0032096246     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01042-0     Document Type: Article

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