An investigation of porous silicon by means of positron annihilation

Journal of Porous Materials

Volumn 7, Issue 1-3, 2000, Pages 323-326

  Dannefaer, S ^a   Wiebe, C ^a   Kerr, D ^a  

^a UNIVERSITY OF WINNIPEG   (Canada)

Author keywords

Porous silicon; Positron annihilation

Indexed keywords

ANNEALING; DESORPTION; HYDROGEN; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; POINT DEFECTS; SEMICONDUCTING FILMS; SILICA; SILICON WAFERS;

POSITRON ANNIHILATION SPECTROSCOPY; VACANCIES;

POROUS SILICON;

EID: 0033881317     PISSN: 13802224     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1009625307658     Document Type: Article

References (5)

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