Total external x-ray reflection and infrared spectroscopy study of porous silicon and its aging

Semiconductors

Volumn 31, Issue 8, 1997, Pages 815-818

  Balagurov, L A ^a   Pavlov, V F ^a   Petrova, E A ^a   Boronina, G P ^a  

^a INSTITUTE OF RARE METALS   (Russian Federation)

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EID: 0005280760     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187259     Document Type: Article

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