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Volumn 92, Issue , 1996, Pages 617-620
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Correlation between light emission and dangling bonds in porous silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
CRYSTAL DEFECTS;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
INTERFACES (MATERIALS);
LIGHT EMISSION;
PHOTOLUMINESCENCE;
SILICA;
TEMPERATURE;
ANODIZATION;
CRYSTALLINITY;
DANGLING BONDS;
RECOMBINATION KILLER CENTERS;
POROUS SILICON;
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EID: 0030562180
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00304-5 Document Type: Article |
Times cited : (16)
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References (14)
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