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Volumn 210, Issue 4, 2000, Pages 613-622

Step bunching behaviour on the {0001} surface of hexagonal SiC

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LATTICE CONSTANTS; MORPHOLOGY; OPTICAL MICROSCOPY; REACTION KINETICS; SILICON CARBIDE; SURFACE TOPOGRAPHY; THERMODYNAMIC PROPERTIES;

EID: 0033875227     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00877-5     Document Type: Article
Times cited : (63)

References (30)
  • 7
    • 85031586501 scopus 로고    scopus 로고
    • in preparation
    • N. Ohtani, in preparation.
    • Ohtani, N.1
  • 25
    • 0004091844 scopus 로고
    • R. Doremus, B. Roberts, & D. Turnbull. New York: Wiley
    • Frank F.C. Doremus R., Roberts B., Turnbull D. Growth and Perfection of Crystals. 1958;411 Wiley, New York.
    • (1958) Growth and Perfection of Crystals , pp. 411
    • Frank, F.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.