Stepped structure on the {0001} facet plane of α-SiC

Surface Science

Volumn 398, Issue 3, 1998, Pages

  Ohtani, Noboru ^a   Katsuno, Masakazu ^a   Takahashi, Jun ^a   Yashiro, Hirokatsu ^a   Kanaya, Masatoshi ^a  

^a NIPPON STEEL CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Silicon carbide; Single crystal surface; Surface structure, morphology, roughness and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL LATTICES; LATTICE CONSTANTS; MORPHOLOGY; SINGLE CRYSTALS; SURFACE ROUGHNESS;

STEPPED STRUCTURE; SURFACE TOPOGRAPHY;

SILICON CARBIDE;

EID: 0032003910     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)80031-9     Document Type: Article

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