Mapping dynamic concentration profiles with micrometric resolution near an active microscopic surface by confocal resonance Raman microscopy. Application to diffusion near ultramicroelectrodes: First direct evidence for a conproportionation reaction

Journal of Electroanalytical Chemistry

Volumn 484, Issue 1, 2000, Pages 1-17

  Amatore, Christian ^a   Bonhomme, Frédéric ^b   Bruneel, Jean Luc ^b   Servant, Laurent ^b   Thouin, Laurent ^a  

^a ECOLE NORMALE SUPÉRIEURE   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTROCHEMISTRY; MICROELECTRODES; MICROSCOPIC EXAMINATION; PARAFFINS; REDUCTION; TRANSPORT PROPERTIES;

CONPROPORTIONATION REACTION; RAMAN MICROSPECTROSCOPY; SPECTROELECTROCHEMISTRY;

RAMAN SPECTROSCOPY;

EID: 0033873871     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(00)00057-7     Document Type: Article

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