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Volumn 164, Issue , 2000, Pages 353-364

Auger electrons from ion tracks

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CARBON; COMPUTATIONAL METHODS; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; IONIZATION; MATHEMATICAL MODELS;

EID: 0033750032     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01064-2     Document Type: Article
Times cited : (37)

References (41)
  • 2
    • 0003498588 scopus 로고
    • Braunschweig: F. Vieweg und Sohn Verlagsgesellschaft
    • Spohr R. Ion tracks and microtechnology. 1990;F. Vieweg und Sohn Verlagsgesellschaft, Braunschweig.
    • (1990) Ion Tracks and Microtechnology
    • Spohr, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.