Formation and photoluminescence of Ge and Si nanoparticles encapsulated in oxide layers

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 74, Issue 1, 2000, Pages 242-247

  Oku, Takeo ^a   Nakayama, Tadachika ^a   Kuno, Masaki ^a   Nozue, Yasuo ^b   Wallenberg, L Reine ^a   Niihara, Koichi ^a   Suganuma, Katsuaki ^a  

^a OSAKA UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL ATOMIC STRUCTURE; EMISSION SPECTROSCOPY; ENCAPSULATION; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON;

GERMANIUM OXIDE; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 0033749835     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00569-3     Document Type: Article

References (26)

1. Alivisatos A.P. MRS Bull. 20:1995;23-32.
2. Alivisatos A.P. Science. 271:1996;933-937.
3. Alivisatos A.P. J. Phys. Chem. 100:1996;13226-13239.
4. Brus L. J. Phys. Chem. Solids. 59:1998;459-464.
5. Alivisatos A.P. MRS Bull. 23:1998;18-23.
6. Nozik A.J., Micic O.I. MRS Bull. 23:1998;24-30.
7. Bimberg D., Grundmann M., Ledentsov N.N. MRS Bull. 23:1998;31-34.
8. Zunger A. MRS Bull. 23:1998;35-42.
9. Zhao W., Schoenfeld O., Aoyagi Y., Sugano T. Appl. Phys. Lett. 65:1994;1290-1292.
10. Zhao W., Schoenfeld O., Kusano J., Aoyagi Y., Sugano T. Jpn. J. Appl. Phys. 33:1994;L899-L901.
11. Li S., Silvers S.J., El-Shall M.S. J. Phys. Chem. B101:1997;1794-1802.
12. Kanemitsu Y., Okamoto S. Mater. Sci. Eng. B48:1997;108-115.
13. Behren J.V., Buuren T.V., Zacharias M., Chimowitz E.H., Fauchet P.M. Solid State Commun. 105:1998;317-322.
14. Maeda Y., Tsukamoto N., Yazawa Y., Kanemitsu Y., Masumoto Y. Appl. Phys. Lett. 59:1991;3168-3170.
15. Kanemitsu Y., Uto H., Masumoto Y., Maeda Y. Appl. Phys. Lett. 61:1992;2187-2189.
16. Kobayashi T., Endoh T., Fukuda H., Nomura S., Sakai A., Ueda Y. Appl. Phys. Lett. 71:1997;1195-1197.
17. Stella A., Tognini P., Bottani C.E., Milani P., Cheyssac P., Kofman R. Thin Solid Films. 318:1998;100-102.
18. Matsumoto H., Uchida H., Matsunaga T. et al. J. Phys. Chem. 98:1994;11549-11556.
19. Tanaka S., Iwai S., Aoyagi Y. Appl. Phys. Lett. 69:1996;4096-4098.
20. Oku T., Nakajima S. J. Mater. Res. 13:1998;1136-1140.
21. Oku T., Niihara K., Suganuma K. J. Mater. Chem. 8:1998;1323-1325.
22. Oku T., Nakajima S. Appl. Phys. Lett. 75:1999;2226-2228.
23. Oku T., Schmid G., Suganuma K. J. Mater. Chem. 8:1998;2113-2117.
24. Oku T., Carlsson A., Wallenberg L.R. et al. J. Solid State Chem. 135:1998;182-193.
25. Oku T., Bovin J.-O. Phil. Mag. A79:1999;821-834.
26. Kanemitsu Y., Ogawa T., Shiraishi K., Takeda K. Phys. Rev. B48:1993;4883-4886.