Calculation of the temperature field induced in a sample by laser illuminated STM-probe

Thin Solid Films

Volumn 368, Issue 1, 2000, Pages 156-162

  Geshev, P I ^a   Demming, F ^b   Jersch, J ^b   Dickmann, K ^b  

^a ENERGY SYSTEMS INSTITUTE   (Russian Federation)

^b UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE METHOD; HEAT TRANSFER; IRRADIATION; LASER BEAM EFFECTS; NANOSTRUCTURED MATERIALS; PROBLEM SOLVING; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

DIELECTRIC SUPPORTS; SEMI-INFINITE SPACES;

METALLIC FILMS;

EID: 0033748485     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00652-0     Document Type: Article

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