On the stress state of silver nanoparticles in ion-implanted silicate glasses

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 871-876

  Dubiel, M ^a   Hofmeister, H ^b   Schurig, E ^a   Wendler, E ^c   Wesch, W ^c  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; ELASTICITY; ELECTRIC POTENTIAL; HIGH RESOLUTION ELECTRON MICROSCOPY; ION IMPLANTATION; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; PARTICLES (PARTICULATE MATTER); RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICATES; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

NANOPARTICLES;

GLASS;

EID: 0033745623     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00797-1     Document Type: Article

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