Specular and diffuse X-ray scattering from tungsten/carbon multilayers having a high reflectivity at 10 keV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3448, Issue , 1998, Pages 291-302

  Macrander, A ^a   Headrick, R L ^a   Liu, C ^a   Erdmann, J ^a   Khounsary, A ^a   Smolenski, K ^a   Krasnicki, S ^a   Maj, J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTROMAGNETIC WAVE REFLECTION; OPTICAL MULTILAYERS; SURFACE ROUGHNESS; TUNGSTEN;

BRILLOUIN ZONE; X-RAY SCATTERING MEASUREMENT;

X RAY SCATTERING;

EID: 0032296031     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.332517     Document Type: Conference Paper

References (17)