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Volumn 82, Issue 1, 2000, Pages 281-285

Fabrication and characterization of nickel-induced laterally crystallized polycrystalline silicon piezo-resistive sensors

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; MICROMACHINING; NICKEL; POLYCRYSTALLINE MATERIALS; PRESSURE TRANSDUCERS; SILICON SENSORS;

EID: 0033740822     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00361-1     Document Type: Article
Times cited : (11)

References (10)
  • 1
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
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    • Petersen K.E. Silicon as a mechanical material. Proceedings of IEEE. Vol. 70:1982;420-457. May.
    • (1982) Proceedings of IEEE , vol.70 , pp. 420-457
    • Petersen, K.E.1
  • 2
    • 0026186714 scopus 로고
    • Surface micro-machined pressure transducers
    • Guckel H. Surface micro-machined pressure transducers. Sensors and Actuators, A. 28:1991;133-146.
    • (1991) Sensors and Actuators, a , vol.28 , pp. 133-146
    • Guckel, H.1
  • 3
    • 0026188346 scopus 로고
    • Piezo-resistive pressure sensors based on poly-crystalline silicon
    • Mosser V., Suski J., Goss J., Obermeier E. Piezo-resistive pressure sensors based on poly-crystalline silicon. Sensors and Actuators, A. 28:1991;113-132.
    • (1991) Sensors and Actuators, a , vol.28 , pp. 113-132
    • Mosser, V.1    Suski, J.2    Goss, J.3    Obermeier, E.4
  • 4
    • 0028608683 scopus 로고
    • Piezo-resistive properties of boron-doped PECVD micro- And poly-crystalline silicon films
    • Materials Research Society
    • Le Berre M., Lavitska E., Maryamova I., Voronin V. Piezo-resistive properties of boron-doped PECVD micro- and poly-crystalline silicon films. Mater. Res. Soc. Symp. Proc. Vol. 343:1994;733-738. Materials Research Society.
    • (1994) Mater. Res. Soc. Symp. Proc. , vol.343 , pp. 733-738
    • Le Berre, M.1    Lavitska, E.2    Maryamova, I.3    Voronin, V.4
  • 5
    • 0018996942 scopus 로고
    • A quantitative model of the effects of grain size on the resistivity of polycrystalline silicon resistors
    • March
    • Lu N.C.C., Gerzberg L., Meindl J.D. A quantitative model of the effects of grain size on the resistivity of polycrystalline silicon resistors. IEEE Electron Device Letters. Vol. EDL-1:1980;38-41. March.
    • (1980) IEEE Electron Device Letters , vol.1 , pp. 38-41
    • Lu, N.C.C.1    Gerzberg, L.2    Meindl, J.D.3
  • 8
    • 0001533333 scopus 로고    scopus 로고
    • Nickel-induced crystallization of amorphous silicon thin film
    • July
    • Jin Z., Bhat G.A., Yeung M., Kwok H.S., Wong M. Nickel-induced crystallization of amorphous silicon thin film. Journal of Applied Physics. Vol. 84(1):1998;194-200. July.
    • (1998) Journal of Applied Physics , vol.84 , Issue.1 , pp. 194-200
    • Jin, Z.1    Bhat, G.A.2    Yeung, M.3    Kwok, H.S.4    Wong, M.5
  • 9
    • 0032715710 scopus 로고    scopus 로고
    • The effects of extended heat treatment on Ni-induced lateral crystallization of amorphous silicon thin film
    • Jan.
    • Jin Z., Moulding K., Kwok H.S., Wong M. The effects of extended heat treatment on Ni-induced lateral crystallization of amorphous silicon thin film. IEEE Trans. Electron Devices. Vol. 46(1):1999;78-82. Jan.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.1 , pp. 78-82
    • Jin, Z.1    Moulding, K.2    Kwok, H.S.3    Wong, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.