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Volumn 61, Issue 1-3, 1997, Pages 400-404

Mechanical sensors based on laser-recrystallized SOI structures

Author keywords

Laser recrystallization; Mechanical sensors; Silicon on insulator structures

Indexed keywords

CRYSTAL IMPURITIES; LASER APPLICATIONS; MICROELECTROMECHANICAL DEVICES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY;

EID: 0031167756     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(97)80296-8     Document Type: Article
Times cited : (17)

References (9)
  • 1
    • 30244468155 scopus 로고
    • Physical model of SOI MOS-transistor for non-equilibrium state
    • A. Druzhinin et al., Physical model of SOI MOS-transistor for non-equilibrium state, Electronnaya Technika, ser. 3, Microelectronika, (5) (1990) 89-91.
    • (1990) Electronnaya Technika, Ser. 3, Microelectronika , vol.5 , pp. 89-91
    • Druzhinin, A.1
  • 2
    • 30244494751 scopus 로고
    • Photosensing structures on the basis of laser-recrystallized polysilicon layers
    • A. Druzhinin et al., Photosensing structures on the basis of laser-recrystallized polysilicon layers, Fizicheskaya Electronica. Lvov, (40) (1990) 119-123.
    • (1990) Fizicheskaya Electronica. Lvov , vol.40 , pp. 119-123
    • Druzhinin, A.1
  • 3
    • 0026473270 scopus 로고
    • Laser-recrystallized polysilicon layers in sensors
    • V.A. Voronin et al., Laser-recrystallized polysilicon layers in sensors, Sensors and Actuators A, 30 (1992) 143-147.
    • (1992) Sensors and Actuators A , vol.30 , pp. 143-147
    • Voronin, V.A.1
  • 4
    • 30244524763 scopus 로고
    • Laser-solid interactions and transient thermal processing of materials
    • J.M. Hode and J.P. Joly, Laser-solid interactions and transient thermal processing of materials, J. Phys. Colloq. C5, supp. 10, 44 (1983) C5-343-C5-350.
    • (1983) J. Phys. Colloq. C5, Supp. 10 , vol.44
    • Hode, J.M.1    Joly, J.P.2
  • 5
    • 0016597193 scopus 로고
    • The electrical properties of polycrystalline silicon films
    • J.Y.W. Seto, The electrical properties of polycrystalline silicon films, J. Appl. Phys., 46 (1975) 5247-5254.
    • (1975) J. Appl. Phys. , vol.46 , pp. 5247-5254
    • Seto, J.Y.W.1
  • 6
    • 0024481433 scopus 로고
    • Piezoresistance in polysilicon and its application to strain gauges
    • P.J. French and A.G.R. Evans, Piezoresistance in polysilicon and its application to strain gauges, Solid-State Electron., 32 (1989) 1-10.
    • (1989) Solid-state Electron. , vol.32 , pp. 1-10
    • French, P.J.1    Evans, A.G.R.2
  • 9
    • 0020931138 scopus 로고
    • Laser-recrystallized polysilicon resistors for sensing and integrated circuits application
    • J. Binder, W. Herring, E. Obermeier, H. Schaber and D. Gutter, Laser-recrystallized polysilicon resistors for sensing and integrated circuits application, Sensors and Actuators, 4 (1983) 525-536.
    • (1983) Sensors and Actuators , vol.4 , pp. 525-536
    • Binder, J.1    Herring, W.2    Obermeier, E.3    Schaber, H.4    Gutter, D.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.