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Volumn 9, Issue 3, 2000, Pages 658-662

Characterization of DLC:Si films by the gas effusion technique

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; GRAPHITIZATION; HYDROCARBONS; HYDROGEN; METHANE; POROUS MATERIALS; SILICON;

EID: 0033738706     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00268-X     Document Type: Article
Times cited : (11)

References (10)
  • 10
    • 0003782774 scopus 로고
    • M.A. Kastner, G.A. Thomas, S.R. Ovshinsky (Eds.), Institute of Amorphous Studies Series, Plenum Press, New York
    • W. Beyer, H. Mell, in: M.A. Kastner, G.A. Thomas, S.R. Ovshinsky (Eds.), Disordered Semiconductors, Institute of Amorphous Studies Series, Plenum Press, New York, 1987.
    • (1987) Disordered Semiconductors
    • Beyer, W.1    Mell, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.