Angular resolved XPS applied to V2O5-based catalysts

Surface Science

Volumn 352-354, Issue , 1996, Pages 750-754

  Devriendt, K ^a   Poelman, H ^a   Fiermans, L ^a   Creten, G ^a   Froment, G F ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

Angle resolved photoemission; Photoelectron diffraction; Titanium oxide; Vanadium oxide; X ray photoelectron spectroscopy

Indexed keywords

CATALYSTS; CHEMICAL BONDS; ELECTRON DIFFRACTION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MONOLAYERS; PHOTOEMISSION; STATISTICAL METHODS; SURFACES; TITANIUM OXIDES; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED PHOTOEMISSION; PHOTOELECTRON DIFFRACTION; VANADIUM OXIDE;

SURFACE STRUCTURE;

EID: 0030145971     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01243-5     Document Type: Article

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