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Volumn 118, Issue 1, 1989, Pages 275-279
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On the quantitative analysis of XPS intensity data for supported catalysts with partial surface segregation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 37949000093
PISSN: 00219517
EISSN: 10902694
Source Type: Journal
DOI: 10.1016/0021-9517(89)90317-5 Document Type: Article |
Times cited : (10)
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References (7)
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