Defect-oriented experiments in fault modelling and fault simulation of microsystem components

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 522-527

  Vermeiren, Wolfgang ^a   Straube, Bernd ^a   Holubek, Andreas ^a  

^a FRAUNHOFER INSTITUTE FOR INTEGRATED CIRCUITS IIS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; MATHEMATICAL MODELS;

MICROSYSTEM COMPONENTS; OPTOELECTRIC TRANSFORMER; RESONANT SILICON BEAM FORCE SENSOR;

MICROELECTRONICS;

EID: 0029735303     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (38)