PEDT/PSS for efficient hole-injection in hybrid organic light-emitting diodes

Synthetic Metals

Volumn 111, Issue , 2000, Pages 139-143

  Elschner, A ^a   Bruder, F ^a   Heuer, H W ^a   Jonas, F ^a   Karbach, A ^a   Kirchmeyer, S ^a   Thurm, S ^a   Wehrmann, R ^a  

^a BAYER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLUMINESCENCE; EVAPORATION; GLASS TRANSITION; HOLE TRAPS; INDIUM COMPOUNDS; LIGHT EMITTING DIODES; MOLECULES; TEMPERATURE;

INDIUM TIN OXIDE; PHENYLAMINES; POLYETHYLENDIOXYTHIOPHENE; STARBUST MOLECULES;

SEMICONDUCTING POLYMERS;

EID: 0033722890     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00328-8     Document Type: Article

References (14)

1. Friend R.H., Gymer R.W., Holmes A.B., Burroughes J.H., Marks R.N., Taliani C., Bradley D.D.C., Dos Santos D.A., Brédas J.L., Lögdlund M., Salaneck W.R. Nature. 397:1999;121.
2. Berntsen A., Croonen Y., Liedenbaum C., Schoo H., Visser R.-J., Vleggaar J., van de Weijer P. Opt. Mater. 9:1998;125.
3. Tang C.W., VanSlyke S.A. Appl. Phys. Lett. 51:1987;913.
4. Scott J.C., Carter S.A., Karg S., Angelopoulos M. Synth. Met. 85:1997;1197.
5. Jonas F., Schrader L. Synth. Met. 41-43:1991;831.
6. M. van der Auweraer, F.C. De Schryver, G. Verbeek, C. Geelen, D. Terrell, S. de Meuter, European Patent EP 349034.
7. Han E., Do L., Niidome Y., Fujihira M. Chem. Lett. 1994;969.
8. Baytron P VP AI 4083 is a special modification of standard Baytron P solution, designed for OLED-application with a significantly reduced content of gel-particles with diameters larger than 100 nm.
9. Bharathan J.M., Yang Y. J. Appl. Phys. 84:1998;3207.
10. Lee S.T., Hou X.Y., Mason M.G., Tang C.W. Appl. Phys. Lett. 77:1998;1593.
11. Thelakkat M., Fink R., Pösch P., Ring J., Schmidt H.-W. Polym. Prepr. 38:1997;394.
12. K. Book, V.R. Nikitenko, H. Bässler, A. Elschner, Synth. Met., these proceedings.
13. Karg S., Scott J.C., Salem J.R., Angelopoulos M. Synth. Met. 80:1996;111.
14. Scott J.C., Kaufman J.H., Brock P.J., DiPietro R., Salem J., Goitia J.A. J. Appl. Phys. 79:1996;2745.