Quantum mechanical influence and estimated errors on interface-state density evaluation by quasi-static C-V measurement

Solid-State Electronics

Volumn 44, Issue 8, 2000, Pages 1511-1514

  Omura, Yasuhisa ^a   Nakajima, Yasuyuki ^b  

^a KANSAI UNIVERSITY   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; MATHEMATICAL MODELS; QUANTUM THEORY;

INTERFACE STATE DENSITY EVALUATION; QUANTUM MECHANICAL EFFECTS;

MOSFET DEVICES;

EID: 0033721707     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00071-X     Document Type: Article

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