On the SiO2-OH capacitance low-temperature thermometers

Physica B: Condensed Matter

Volumn 284-288, Issue PART II, 2000, Pages 1994-1995

  Rotter, Miloš ^a   Boutard, Dominique ^b   Ladieu, François ^b   Pari, Patrick ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

Dielectrics; Inter digital capacitor; Silica; Thermometry

Indexed keywords

EID: 0033721207     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02744-1     Document Type: Article

References (6)

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5. D. Osheroff, S. Rogge, D. Natelson, Czech. J. Phys. 46 (1996) S6-3295.
6. D. Boutard, P. Aranda, F. Ladieu, P. Pari, M. Rotter, J. Non Cryst. Solids 245 (1999) 27.