On the use of dielectric films in temperature measurements: Application to the realization of capacitive thermometers for temperatures <5 K

Journal of Non-Crystalline Solids

Volumn 245, Issue 1-3, 1999, Pages 27-32

  Boutard Gabillet, D ^a   Aranda, P ^a   Ladieu, F ^a   Pari, P ^a   Rotter, M ^b  

^a CEA SACLAY   (France)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CHEMICAL BONDS; DIELECTRIC PROPERTIES OF SOLIDS; INFRARED SPECTROSCOPY; ION BEAMS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPECTROMETRY; TEMPERATURE MEASUREMENT; THERMOMETERS;

CAPACITIVE THERMOMETERS;

DIELECTRIC FILMS;

EID: 0032677999     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00869-2     Document Type: Article

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