Dielectric Properties of Vitreous Silica with Various Hydroxyl Concentrations

Journal of Low Temperature Physics

Volumn 110, Issue 1-2, 1998, Pages 269-274

  Van Rooijen, Richard ^a   Marchenkov, Alexei ^a   Akimoto, Hikota ^a   Jochemsen, Reijer ^a   Frossati, Giorgio ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; COMPOSITION EFFECTS; DIELECTRIC PROPERTIES OF SOLIDS; LOW TEMPERATURE PROPERTIES; PERMITTIVITY; TEMPERATURE MEASUREMENT; THERMAL EFFECTS;

DIELECTRIC SUSCEPTIBILITY; HOMOSIL GLASS; HYDROXYL RADICALS; SUPRASIL GLASS;

FUSED SILICA;

EID: 0031648259     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1022520329931     Document Type: Article

References (10)

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6. Private communications with Dr. S. Thomas from Heraeus Quartzglass.
7. - was annealed at a different temperature by Dr. S. Thomas from Hereaus Quartzglass.
8. W.A. Philips, Amorphous Solids, Springer, Berlin (1981).
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10. G. Frossati, J. Gilchrist, H. Godfrin, and D. Thoulouze, in Physics at Ultra Low Temperature, edited by T. Sugawara (Physical Society of Japan), 312 (1978).