Modeling and simulation of real defects using fuzzy logic

Proceedings-Design Automation Conference

Volumn , Issue , 2000, Pages 631-636

  Attarha, Amir ^a   Nourani, Mehrdad ^a   Lucas, Caro ^b  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

^b UNIVERSITY OF TEHRAN   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; LOGIC GATES; VLSI CIRCUITS;

BRIDGING FAULT; STUCK-AT FAULT;

FUZZY SETS;

EID: 0033720598     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2000.855389     Document Type: Article

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