Raman characterization of epitaxial Cu-In-Se thin films

Thin Solid Films

Volumn 371, Issue 1, 2000, Pages 36-39

  Ely, James H ^a   Ohno, T R ^a   Furtak, T E ^a   Nelson, A J ^b  

^a Department of Geology and Geological Engineering   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

CHALCOPYRITES;

SEMICONDUCTING FILMS;

EID: 0033719551     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01002-6     Document Type: Article

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