Correlation of reflection electron diffraction patterns, Raman spectra and compositions in "CuInSe2" films

Journal of Crystal Growth

Volumn 173, Issue 1-2, 1997, Pages 97-103

  Igarashi, Osamu ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; STOICHIOMETRY;

REFLECTION ELECTRON DIFFRACTION (RED) PATTERNS;

SEMICONDUCTING FILMS;

EID: 0031547039     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00798-1     Document Type: Article

References (8)

1. O. Igarashi, J. Crystal Growth 130 (1993) 343.
2. O. Igarashi, J. Crystal Growth 143 (1994) 213.
3. H. Tanino, T. Maeda, H. Fujikake, H. Nakanishi, S. Endo and T. Erie, Phys. Rev. B 28 (1992) 13323.
4. G. Zahn and P. Paufier, Cryst. Res. Technol. 23 (1988) 499.
5. W. Hönle, G. Kühn and U.-C. Boehnke, Cryst. Res. Technol. 23 (1988) 1347.
6. B. Schumann, A. Tempel and G. Kühn, Solar Cells 16 (1986) 43.
7. W. Hönle, G. Kühn and U.-C. Boehnke, J. Mater. Sci. 24 (1989) 2483.
8. T. Hahn, Ed., International Tables for Crystallography, Vol. A (Reidel, Dordrecht, 1983) p. 646.