Analysis of occupational and displacive disorder using the atomic pair distribution function: A systematic investigation

Zeitschrift fur Kristallographie

Volumn 215, Issue 11, 2000, Pages 661-668

  Proffen, Th ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DATA ANALYSIS; RADIATION SCATTERING; SIMULATION; STRUCTURE ANALYSIS; SYSTEM ANALYSIS; TECHNIQUE;

EID: 0033710184     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (31)

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