Sum rules for surface plasmon frequencies

Ultramicroscopy

Volumn 65, Issue 1-2, 1996, Pages 53-60

  Apell, S P ^a,b   Echenique, P M ^a   Ritchie, R H ^a,c  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

poisson equation; sum rules; surface plasmons

Indexed keywords

INTERFACES (MATERIALS); NATURAL FREQUENCIES; SURFACE PHENOMENA;

MIE PARTICULATE MODES; POISSON EQUATION; SUM RULES; SURFACE PLASMONS;

ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY;

EID: 0030250835     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00055-1     Document Type: Article

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