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Volumn 214, Issue , 2000, Pages 707-711
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Structural and chemical analysis of CdSe islands in a ZnSe matrix by transmission electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ANALYSIS;
MONOLAYERS;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
SEMICONDUCTOR QUANTUM DOTS;
TEMPERATURE;
TRANSMISSION ELECTRON MICROSCOPY;
CADMIUM SELENIDE;
CADMIUM ZINC SELENIDE;
COMPOSITION EVALUATION BY LATTICE FRINGE ANALYSIS;
CRITICAL WETTING LAYER THICKNESS;
MIGRATION ENHANCED EPITAXY;
ZINC SELENIDE;
MOLECULAR BEAM EPITAXY;
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EID: 0033704109
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00183-4 Document Type: Article |
Times cited : (2)
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References (12)
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