Morphology of ultrathin CdSe quantum confinement layers in ZnSe matrices

Journal of Crystal Growth

Volumn 203, Issue 3, 1999, Pages 362-370

  Chinyama, K G ^a   O'Donnell, K P ^a   Rosenauer, A ^b   Gerthsen, D ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; EXCITONS; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; MONOLAYERS; MORPHOLOGY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS;

CADMIUM SELENIDE; CORRESPONDENCE ANALYSIS; LATTICE IMAGES DIGITAL ANALYSIS; PHOTOLUMINESCENCE SPECTROSCOPY; QUANTUM CONFINEMENT LAYERS; ZINC CADMIUM SELENIDE;

CRYSTAL GROWTH;

EID: 0032687598     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00099-8     Document Type: Article

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