Microstructure of YBCO and YBCO/SrTiO3/YBCO* PLD thin films on sapphire for microwave applications

Materials Research Society Symposium - Proceedings

Volumn 603, Issue , 2000, Pages 163-168

  Lorenz, M ^a   Hochmuth, H ^a   Natusch, D ^a   Tharigen T ^a   Svetchnikov, V L ^b   Zandbergen, H W ^b   Schafer C ^c   Kastner G ^c   Hesse, D ^c  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b Natl Ctr High Resolution E   (Netherlands)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; MICROWAVE DEVICES; PULSED LASER APPLICATIONS; SAPPHIRE; STACKING FAULTS; STRESSES; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

CERIUM DIOXIDE; STRESS MODULATION; STRONTIUM TITANATE;

THIN FILMS;

EID: 0033693917     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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