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Volumn 214, Issue , 2000, Pages 880-884

Growth and characterisation of bulk Zn1-xBexSe, Zn1-x-yMgxBeySe and Zn1-xBexTe crystals

(9) Firszt, F a Legowski, S a Meczynska H a Szatkowski, J a Banasiak, A a Paszkowicz, W b Falke, U c Schultze, S d Hietschold, M d

a NICOLAUS COPERNICUS UNIVERSITY (Poland)

b INSTITUTE OF PHYSICS (Poland)

c UNIVERSITY OF LEIPZIG (Germany)

d CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; HEAT TREATMENT; HIGH RESOLUTION ELECTRON MICROSCOPY; LATTICE CONSTANTS; PHASE COMPOSITION; PHOTOLUMINESCENCE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BERYLLIUM CHALCOGENIDES; DEFECT STRUCTURE; DENSITY OF DEFECT; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHASE ANALYSIS; ZINC BERYLLIUM SELENIDE; ZINC BERYLLIUM TELLURIDE; ZINC MAGNESIUM BERYLLIUM SELENIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0033688225 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(00)00251-7 Document Type: Article

Times cited : (11)

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