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Journal of Crystal Growth

Volumn 182, Issue 1-2, 1997, Pages 45-52

Microstructural study of pseudomorphic ZnSe films grown on bare GaAs substrates

(6) Vennegues P a Muller, B a Bousquet, V a Ongaretto, C a Tournie E a Faurie, J P a

a CNRS (France)

Author keywords

II VI semiconductors; MBE; Stacking faults; TEM

Indexed keywords

MICROSCOPIC EXAMINATION; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; STACKING FAULTS; ZINC SULFIDE;

PSEUDOMORPHIC FILMS;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0031381743 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(97)00324-2 Document Type: Article

Times cited : (6)

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