Residual stresses and crystallographic texture in hard-chromium electroplated coatings

Surface and Coatings Technology

Volumn 96, Issue 2-3, 1997, Pages 148-162

  Pina, J ^a   Dias, A ^a   Francois M ^b   Lebrun, J L ^c  

^a UNIVERSITY OF COIMBRA   (Portugal)

^b UNIVERSITÉ DE NANTES   (France)

^c CNRS   (France)

Author keywords

Chromium; Coatings; Residual stresses; X ray diffraction

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; ELECTROPLATING; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PROTECTIVE COATINGS; RESIDUAL STRESSES; STRESS ANALYSIS; SUBSTRATES; TEXTURES; X RAY CRYSTALLOGRAPHY;

KRONER ESHELBY MODEL; ORIENTATION DISTRIBUTION FUNCTION (ODF); REUSS' HYPOTHESIS; X RAY ELASTIC CONSTANTS (XEC);

CHROMIUM PLATING;

EID: 0031268736     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00075-3     Document Type: Article

References (20)

1. M. Barral, J.L. Lebrun, J.M. Sprauel, G. Maeder, X-Ray Macrostress Determination on Textured Material; Use of the ODF for Calculating the X-Ray Compliances, Metall. Transactions 18A (1987) 1229-1238.
2. J.M. Sprauel, M. François, M. Barral, in: G. Beck et al. (eds.), Calculation of X-Ray Elastic Constants of Textured Materials Using Kröner Model, Proc. Int. Conf. on Residual Stresses 2 (ICRS2), Nancy, France, Elsevier Applied Science, London, 1989, pp. 172-177.
3. M. François, J.M. Sprauel, J.L. Lebrun, Calculation of X-Ray Elastic Constants on Textured Materials with Kröner Model, Proc. 9th Int. Conf. on Experimental Mechanics, 3 (1990) pp. 1272-1280.
4. V. Hauk, W.K. Krug, R.W.M. Oudeihoven, L. Pintschovius, Calculation of Lattice Strains in Crystallites with an Orientation Corresponding to the Ideal Rolling Texture of Iron, Z. Metallkde 79 (1988) 159-163.
5. M. Zaouali, J.L. Lebrun, P. Gergaud, X-Ray Diffraction Determination of Texture and Internal Stresses in Magnetron PVD Molybdenum Thin Films, Surf. Coat. Tech. 50 (1991) 5-10.
6. E. Kröner, Berechnung der Elastichen Konstanten des Vielkristails aus den Konstanten des Einkristalls, Zeitschriftn für Physik 151 (1958) 504-518.
7. A.R. Jones, Microcracks in Hard Chromium Electrodeposits, Plating and Surface Finishing, April, 1989, pp. 62-66.
8. M. Dahms, H.J. Bunge, The Iterative Series-Expansion Method for Quantitative Texture Analysis. I. General Outline, J. Appl. Cryst. 22 (1989) 439-447.
9. H.J. Bunge, Texture Analysis in Materials Science, Butterworth, London, 1982.
10. D.H. Chung, W.R. Buessem, in: F.W. Vahldiek, S.A. Mersol (eds.), The Elastic Anisotropy of Crystals, Anisotropy in Single Crystal Refractory Compounds, Plenum Press, Vol. 2, 1968, pp. 217-244.
11. N.M. Martyak, R. Weil, Structure Studies of Chromium Electro-deposits, Materials Characterization 28 (1992) 113-120.
12. P. Morisset, Chromage Dur et Décoratif, ed. CETIM, Senlis, France, 1988.
13. V. Cassagne, J.L. Lebrun, A. Le Cornec, Residual Stresses in Electroplated Chromium, Proc. Fourth International Conference on Residual Stresses (ICRS4), Baltimore, USA, ed. Society for Experimental Mechanics, Inc, Bethel, USA (1994) pp. 752-757.
14. C.S. Barrett, Structure of Metals - Crystallographic Methods, Principles, and Data, McGraw-Hill Book Company, Inc., New York, 1943.
15. M. Ohtsuka, H. Matsuoka, Y. Hirose, H. Ishii, Young's Modulus Measurement of Chromium Electroplating, Adv. X-Ray Analysis 35 (1991) 527-535.
16. J. Lu, C. Corniquet, G. Vasseur, J.F. Flavenot, B. Sutler, Réduction des Contraintes Résiduelles dans des Dépöts de Chrome en Courant Continu et Pulsé, Galvano-Organo-Traitements de Surface 644 (1994) 237-243.
17. H.U. Baron, V. Hauk, Röntgenografische Ermittlung der Bigenspannungen in Kristailit-gruppen von Fasertexturierten Werks-toffen, Z. Metallkde 79 (1988) 127-131.
18. D.T. Gawne, Failure of Electrodeposited Chromium Coatings on Cast Iron Substrates, Thin Solid Films 118 (1984) 385-393.
19. W.H. Safranek, The Properties of Electrodeposited Metals and Alloys, Elsevier, New York, 1986.
20. M.E. Todaro, G.P. Capsimalis, E.S. Chen, Acoustic Emission During Chromium Electrodeposition, J. Vac. Sci. Technol. A 4(6) (1986) 2815-2818.