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Volumn 36, Issue 11, 2000, Pages 1221-1235

Informative essence of noise: New findings in the electrochemistry of silicon

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 0033675887     PISSN: 10231935     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02757698     Document Type: Article
Times cited : (8)

References (25)
  • 9
    • 85017254130 scopus 로고
    • Oxides and Oxide Films, New York: Marcel Dekker
    • (1975) , vol.3
    • Vijh, A.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.