|
Volumn 594, Issue , 2000, Pages 351-364
|
A brittle to ductile transition (BDT) in adhered thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COPPER;
CRACK PROPAGATION;
DUCTILITY;
FRACTURE TOUGHNESS;
INTERFACES (MATERIALS);
PLASTICITY;
STRESS ANALYSIS;
STRESS INTENSITY FACTORS;
THIN FILMS;
TOUGHNESS;
TUNGSTEN;
YIELD STRESS;
BRITTLE TO DUCTILE TRANSITION (BDT);
FRACTURE ENERGY;
NANOINDENTATION TECHNIQUE;
METALLIC FILMS;
|
EID: 0033645233
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (20)
|
References (22)
|